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A 7.5 mW-43 dB LO leakage source-driven wideband CMOS millimeter-wave mixer

期刊: ELECTRONICS LETTERS, 2021; 57 (11)

This paper presents a millimeter-wave (mm-wave) V-band mixer. The source-driven transformer-coupled up-converter topology can alleviate the local osci......

Automated alignment in mask-free photolithography enabled by micro-LED arrays

期刊: ELECTRONICS LETTERS, 2021; 57 (19)

We present an automated control system for micro scale positioning, based on single pixel imaging and fluorescence. By projecting a chequerboard array......

A 3D printed metallized Fabry-Perot cavity antenna with improved bandwidth and low side-lobe levels

期刊: ELECTRONICS LETTERS, 2021; 57 (12)

A 3D printed metallized Fabry-Perot cavity antenna centred at 5.8 GHz is presented in this letter. A non-uniform grid superstrate and a choke groove a......

Accurate and efficient solution of electromagnetic scattering from randomly rough surface using MoM-SMCG with adaptive quadrature

期刊: ELECTRONICS LETTERS, 2021; 57 (18)

An adaptive quadrature method is proposed and implemented with the full-wave MoM-SMCG to accurately and efficiently solve the electromagnetic scatteri......

A low phase noise microwave source for high-performance CPT Rb atomic clock

期刊: ELECTRONICS LETTERS, 2021; 57 (17)

Phase noise of the frequency synthesizer is one of the main limitations to the short-term stability of microwave atomic clocks. Here, a low-noise, sim......

Encoding discriminative representation for point cloud semantic segmentation

期刊: ELECTRONICS LETTERS, 2021; 57 (6)

The main challenge for semantic segmentation based on deep learning is how to encode effective representation due to the nature of point cloud. This l......

A dual-phase-conducted type bearingless switched reluctance flywheel motor with hybrid outer rotor

期刊: ELECTRONICS LETTERS, 2021; 57 (9)

A novel dual-phase-conducted type bearingless switched reluctance flywheel motor is proposed, which has a hybrid outer rotor comprising circular segme......

Depth map super-resolution via shape-adaptive non-local regression and direction-based local smoothness

期刊: ELECTRONICS LETTERS, 2021; 57 (12)

In this letter, a novel single depth map super-resolution algorithm is proposed, which combines the non-local prior and local smoothness prior. Unlike......

A Schottky diode and FET-paralleled analogue predistorter for 5G small-cell base stations

期刊: ELECTRONICS LETTERS, 2021; 57 (6)

This letter presents an analogue predistorter (APD) named Schottky diode (SD) and field effect transistor (FET)-paralleled APD (SDFP-APD) for the fift......

Efficient field-programmable gate array-based reconfigurable accelerator for deep convolution neural network

期刊: ELECTRONICS LETTERS, 2021; 57 (6)

Deep convolutional neural networks (DCNNs) have been widely applied in various modern artificial intelligence (AI) applications. DCNN's inference is a......

Stochastic exponential stabilization of hybrid systems with time-varying delays via adaptive control

期刊: ELECTRONICS LETTERS, 2021; 57 (6)

The problem of stochastic stabilization for a class of hybrid dynamical systems with time-varying delays is investigated by adaptive control approach.......

Noise-enhanced quantum annealing approach and its application in plug-in hybrid electric vehicle charging optimization

期刊: ELECTRONICS LETTERS, 2021; 57 (8)

A noise-enhanced quantum annealing algorithm is proposed for an efficient annealing process to obtain the optimal solution. Simultaneous multiple nois......

Face illumination processing via dense feature maps and multiple receptive fields

期刊: ELECTRONICS LETTERS, 2021; 57 (16)

Recently, illumination processing of facial image based on generative adversarial networks has made favourable progress. However, the image quality is......

Photonics-based de-chirp processor with the capability of processing dual-band signals

期刊: ELECTRONICS LETTERS, 2021; 57 (12)

A photonics-based de-chirp processor with the capability of processing dual-band linearly frequency-modulated (LFM) waveforms is proposed and demonstr......

Fault recognition based test score for improving the accuracy of defect diagnosis

期刊: ELECTRONICS LETTERS, 2021; 57 (15)

Diagnosis is an essential step to improve the yield in semiconductor manufacturing industry. It is performed on a failing chip to determine the locati......

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